CHIPS Microchannel plate gate upgrade module� Combined Sources Sought/Notice of Intent to Sole Source
COMMERCE, DEPARTMENT OF
About this opportunity
***THIS IS A COMBINED SOURCES SOUGHT NOTICE AND NOTICE OF INTENT TO SOLE SOURCE*** In response to the CHIPS for America Act, NIST has a mission to perform and develop measurement science requested to support the domestic semiconductor industry. The Material Measurement Laboratory (MML) at the National Institute of Standards and Technology (NIST) is involved in materials characterization efforts using atom probe tomography (APT). A particular research focus of the atom probe instrument is to study the effect of laser wavelength on semiconductor materials to characterize, quantify, and ameliorate sources of measurement bias and uncertainty, thereby improving accuracy, repeatability, and reproducibility of APT measurements. This work involves three-dimensional (3D) atomic imaging of nanoscale...